Propagation Delay, εeff & Timing
Effective dielectric constant, propagation delay per length, trace length matching from a skew budget, rise time to bandwidth and knee frequency, critical length and wavelength on the board.
Method, formulas and references
Relations used
(1)tpd = √εeff / c
A signal travels at c/√εeff. In stripline εeff equals the laminate εr. In microstrip part of the field is in air, so εeff is lower. The microstrip option uses the Hammerstad–Jensen expressions with thickness correction. For coated or coupled lines, take εeff from the impedance calculator's field solver.
(2)f3dB ≈ 0.35 / tr, fknee ≈ 0.5 / tr
The critical length is a rule of thumb: once a trace's delay exceeds about one sixth of the rise time, reflections become visible and the line should be terminated and impedance-controlled.
References
- E. Hammerstad, Ø. Jensen, “Accurate Models for Microstrip Computer-Aided Design,” IEEE MTT-S, 1980.
- H. Johnson, M. Graham, High-Speed Digital Design, Prentice Hall, 1993.
- E. Bogatin, Signal and Power Integrity – Simplified, 3rd ed., 2018.
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